Tag Archives: AFM
Probing the mysteries of nanoscale wear
Posted on 01. Sep, 2010 by perspective.
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Mechanical Engineering Assistant Professor Kevin Turner is working with Illinois-based Advanced Diamond Technologies (ADT) andcollaborators at the University of Pennsylvania to design and fabricate high-performance, wear-resistant diamond probes for atomic-force microscopy, or AFM. AFM is a widely used research technique for measuring the nanoscale topography of surfaces. A sharp probe with a point that has [...]
